发明名称 Semiconductor memory device having a large band width and allowing efficient execution of redundant repair
摘要 A memory cell array includes a normal memory cell array divided into a plurality of memory blocks, a row redundant circuit and a column redundant circuit. Independent data lines are provided for the normal memory cell array, the row redundant circuit and the column redundant circuit, respectively. A data line shift circuit selectively connects each data I/O line to a global data bus. A redundant control circuit generates a shift setting signal corresponding to the defective address for setting a connection form in a data line shift circuit when an address signal matches with a defective address.
申请公布号 US2002024859(A1) 申请公布日期 2002.02.28
申请号 US20010943010 申请日期 2001.08.31
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 OOISHI TSUKASA
分类号 G11C29/04;G11C7/10;G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/04
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