发明名称 Regulable test integrated circuit system for signal noise and method of using same
摘要 A regulable test IC system for signal noise on the electrical analysis point, comprising: a power supply, for providing a test voltage in the system; a pulse generator, for providing a test frequency in a noise testing of the system; a regulable test IC with different signal pads capable of regulable testing signal noise with the test frequency from the pulse generator and the test voltage from the power supply in a plurality of built-in specific structures, under the basis of an assigned current standard; and a digital detection device with a display, for displaying and recording the result of the regulable test.
申请公布号 US2002024353(A1) 申请公布日期 2002.02.28
申请号 US20010858538 申请日期 2001.05.17
申请人 LEE MIN-LIN;SHYU CHIN-SUN 发明人 LEE MIN-LIN;SHYU CHIN-SUN
分类号 G01R29/26;G01R31/3185;(IPC1-7):G01R31/26 主分类号 G01R29/26
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