发明名称 Methods of forming a contact structure in a semiconductor device
摘要 A method of forming a contact structure in a semiconductor device includes forming an interlayer insulating layer containing impurities on a semiconductor substrate. The interlayer insulating layer is patterned to form a pad contact hole. The pad contact hole is filled with a conductive pad. Thermal oxidation annealing is then carried out to form an oxide layer on a top surface of the conductive pad and at an interface between the conductive pad and the interlayer insulating layer.
申请公布号 US2002025669(A1) 申请公布日期 2002.02.28
申请号 US20010754266 申请日期 2001.01.05
申请人 HWANG MIN-WK;NOH JUN-YONG 发明人 HWANG MIN-WK;NOH JUN-YONG
分类号 H01L21/28;H01L21/316;H01L21/60;H01L21/768;H01L21/8242;H01L23/522;H01L27/108;(IPC1-7):H01L21/476 主分类号 H01L21/28
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