发明名称 Method for inspection of circuit boards and apparatus for inspection of circuit boards
摘要 The present invention is to propose a circuit board inspection method and its apparatus in which extraction of all of minute parts placed on a circuit board is possible without being influenced by an amount of deformation of the circuit board; according to the present invention, the method for inspecting the circuit board comprises a step of measuring a 3-dimensional shape of the circuit board which is an inspection object and making it to be a surface-shape measurement data, a step of automatically estimating the amount of deformation of the circuit board from measured surface-shape measurement data of whole of the surface of the circuit board, a step of automatically generating an approximated curved surface of the circuit board from an estimated result of the above-mention step, and a step of performing a subtraction process between the approximated curved surface generated in the abovementioned step and the surface-shape measurement data; the apparatus for inspecting the circuit board comprises processing sections for performing the above-mentioned respective steps.
申请公布号 US2002024660(A1) 申请公布日期 2002.02.28
申请号 US20010916181 申请日期 2001.07.26
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 HIGASHI NOBORU;NAGAI DAISUKE;KAIDA KENICHI
分类号 G01B11/24;G01B11/245;G01N21/956;H05K13/08;(IPC1-7):G01N21/88 主分类号 G01B11/24
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