发明名称 Semiconductor device, manufacturing method therefor, and thin film capacitor
摘要 A semiconductor device provided with a thin film capacitor having a small equivalent series inductance is provided, which can be operated at a high frequency range and contributes to size reduction of the electronic devices. The semiconductor device comprises a device formed on a silicon substrate 1a, interlayer insulating films 3a, 3b, and 3c, wiring blocks including a power source wire block and a ground wire block, and a thin film capacitor 14 formed on an uppermost insulating layer. The thin film capacitor 14 comprises a lower electrode 6 connected to the ground wire block 4e through a contact 5d, an upper electrode 8 which is connected to the power source wire block 4d through a contact 5d, and which extends above the lower electrode 6, and a dielectric layer 7 which is inserted between the lower and the upper electrodes.
申请公布号 US2002025623(A1) 申请公布日期 2002.02.28
申请号 US20010903316 申请日期 2001.07.11
申请人 NEC CORPORATION 发明人 YAMAMICHI SHINTARO;MORI TORU;SHIBUYA AKINOBU;YAMAZAKI TAKAO;SHIMADA YUZO
分类号 H01G4/12;H01G4/30;H01G4/33;H01G13/00;H01L21/02;H01L21/60;H01L21/822;H01L23/522;H01L27/04;H01L27/06;(IPC1-7):H01L21/824;H01L21/20 主分类号 H01G4/12
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