发明名称 ARRAY SUBSTRATE INSPECTING METHOD
摘要 PURPOSE: To easily detect off-leak failures in ASWs in array boards which constitute a liquid crystal panel. CONSTITUTION: After bringing the ASW 1-n into a nonconducting state by two types of OFF-state voltages Vgs with different voltage values and holding signals for test written in auxiliary capacitances 13 for a predetermined time, the written signals for test are each read, and signal waveforms obtained from the two signals for test are compared with each other to facilitate the determination of the presence or absence of off-leak failures and classification.
申请公布号 KR20020014985(A) 申请公布日期 2002.02.27
申请号 KR20010028641 申请日期 2001.05.24
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TOMITA SATORU
分类号 G01R31/02;G01R31/00;G02F1/13;G02F1/133;G02F1/136;G02F1/1368;G09F9/00;G09G3/00;G09G3/20;G09G3/36;H01L29/786;(IPC1-7):G02F1/13 主分类号 G01R31/02
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