发明名称 Fabrication process of semiconductor substrate
摘要 SOI substrates are fabricated with sufficient quality and with good reproducibility. At the same time, conservation of resources and reduction of cost are realized by reuse of the wafer and the like.Carried out to achieve the above are a step of bonding a principal surface of a first substrate to a principal surface of a second substrate, the first substrate being a Si substrate in which at least one layer of non-porous thin film is formed through a porous Si layer, a step of exposing the porous Si layer in a side surface of a bonding substrate comprised of the first substrate and the second substrate, a step of dividing the porous Si layer by oxidizing the bonding substrate, and a step of removing the porous Si and oxidized porous Si layer on the second substrate separated by the division of the porous Si layer.
申请公布号 US6350702(B2) 申请公布日期 2002.02.26
申请号 US20010840895 申请日期 2001.04.25
申请人 CANON KABUSHIKI KAISHA 发明人 SAKAGUCHI KIYOFUMI;YONEHARA TAKAO
分类号 H01L21/20;H01L21/02;H01L21/762;H01L27/12;(IPC1-7):H01L21/00 主分类号 H01L21/20
代理机构 代理人
主权项
地址