发明名称 Semiconductor memory device and manufacturing method of the same
摘要 A plurality of charge storage electrodes are formed on an interlayer insulating film which is formed on a silicon substrate. A plurality of insulating members which surround periphery of the charge storage electrodes and which are separated from each other are formed. A capacitance insulating film is so formed as to cover the plurality of charge storage electrodes and the plurality of insulating members. A plate electrode is formed on the capacitance insulating film. The insulating members are formed of a silicon nitride film which has a function as an etching stopper for protecting the interlayer insulating film.
申请公布号 US6350647(B2) 申请公布日期 2002.02.26
申请号 US20010772981 申请日期 2001.01.31
申请人 NEC CORPORATION 发明人 SAKAO MASATO
分类号 H01L27/108;H01L21/02;H01L21/8242;H01L27/10;(IPC1-7):H01L21/824 主分类号 H01L27/108
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