发明名称 |
Semiconductor memory device and manufacturing method of the same |
摘要 |
A plurality of charge storage electrodes are formed on an interlayer insulating film which is formed on a silicon substrate. A plurality of insulating members which surround periphery of the charge storage electrodes and which are separated from each other are formed. A capacitance insulating film is so formed as to cover the plurality of charge storage electrodes and the plurality of insulating members. A plate electrode is formed on the capacitance insulating film. The insulating members are formed of a silicon nitride film which has a function as an etching stopper for protecting the interlayer insulating film.
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申请公布号 |
US6350647(B2) |
申请公布日期 |
2002.02.26 |
申请号 |
US20010772981 |
申请日期 |
2001.01.31 |
申请人 |
NEC CORPORATION |
发明人 |
SAKAO MASATO |
分类号 |
H01L27/108;H01L21/02;H01L21/8242;H01L27/10;(IPC1-7):H01L21/824 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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