发明名称 |
Method of fabricating dual damascene structure using a hard mask |
摘要 |
A method of fabricating dual damascene structure. A substrate having devices and a defined conductive layer is provided. A dielectric layer and a hard mask material layer are formed respectively over the substrate. An opening is defined within the hard mask material layer. Because of the different selectivity of the hard mask material layer and the dielectric layer, a trench is formed within the dielectric layer by defining the hard material mask layer and a portion of dielectric layer until the conductive layer is exposed. The cross shape of the trench has a wider opening and a narrower bottom. A metal layer is then formed and the trench is filled up with the metal layer. The process of dual damascene structure is accomplished..
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申请公布号 |
US6350682(B1) |
申请公布日期 |
2002.02.26 |
申请号 |
US19980073920 |
申请日期 |
1998.05.06 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
LIAO KUAN-YANG |
分类号 |
H01L21/768;(IPC1-7):H01L21/476;H01L21/44;H01L21/461 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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