发明名称 METHOD FOR FORMING CAPACITOR ELECTRODE USING HARD MASK
摘要 PURPOSE: A method for forming a capacitor electrode using a hard mask is provided to form an electrode of a vertical type, by etching a Pt layer while using a Ru layer as the hard mask or a Pt layer, Ir layer or IrO2 layer as the hard mask. CONSTITUTION: The Pt layer(15) to constitute a lower electrode is formed. A Ru hard mask(16A) is formed on the Pt layer. The Pt layer not covered with the Ru hard mask is selectively etched to form a Pt lower electrode. A dielectric layer and an upper electrode are formed on the Pt lower electrode and the Ru hard mask.
申请公布号 KR20020014228(A) 申请公布日期 2002.02.25
申请号 KR20000047399 申请日期 2000.08.17
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK, CHANG HEON
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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