发明名称
摘要 PURPOSE: To enable the chip area to be reduced by providing bumps on active parts whereto the current of a semiconductor substrate is supplied through the intermediary of a soft insulating film. CONSTITUTION: Bumps 14, 15 are provided on active regions whereto the current of a semiconductor substrate 18 is supplied through the intermediary of a soft insulating film 8. For example, a p-type base diffused region 3 is formed on the surface layer of an n-type semiconductor substrate 18 and an n-type emitter region 4 is formed on the surface of said region 3. Besides, the surface of the semiconductor substrate 18 is covered with an oxide film 2 while an Al electrode 7 is in contact with the regions 3 and 4 through a base aperture part 5 and an emitter aperture part 6. Furthermore, a polyimide made insulating film 8 is formed on the Al electrode 7 as well as a base bump 14 and an emitter bump 15 made of solder are formed on the insulating film 8 through the intermediary of an underlying metallic films 9. In such a constitution, the Al electrode 7 is in contact with the base bump 14 and the emitter bump 15 respectively using a base contact part 16 and an emitter contact part 17.
申请公布号 JP3259562(B2) 申请公布日期 2002.02.25
申请号 JP19950011306 申请日期 1995.01.27
申请人 发明人
分类号 H01L21/768;H01L21/321;H01L21/56;H01L21/60;H01L23/12 主分类号 H01L21/768
代理机构 代理人
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