发明名称 |
METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR HAVING REDUCED RESISTANCE BETWEEN SOURCE AND DRAIN AND FABRICATING METHOD THEREOF |
摘要 |
PURPOSE: A metal oxide semiconductor field effect transistor(MOSFET) is provided to reduce resistance in a channel region between a source extension region and a drain extension region by decreasing the length of a gate electrode. CONSTITUTION: A semiconductor substrate is prepared. The gate electrode(220) is formed on the semiconductor substrate(200). Deep source/drain regions(230) are formed on the semiconductor substrate outside the sidewall of the gate electrode. Source/drain extension regions(240) extend toward the channel region under the gate electrode, thinner than the deep source/drain regions on the semiconductor substrate. The first silicide layer of the first thickness is formed on the deep source/drain regions. The second silicide layer extends from the first silicide layer on a partial surface of the source/drain extension region, having the second thickness smaller than the first thickness of the first silicide layer.
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申请公布号 |
KR100327347(B1) |
申请公布日期 |
2002.02.22 |
申请号 |
KR20000042154 |
申请日期 |
2000.07.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, YOUNG WUG;YANG, JEONG HWAN |
分类号 |
H01L21/28;H01L21/336;H01L29/78;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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