发明名称 METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR HAVING REDUCED RESISTANCE BETWEEN SOURCE AND DRAIN AND FABRICATING METHOD THEREOF
摘要 PURPOSE: A metal oxide semiconductor field effect transistor(MOSFET) is provided to reduce resistance in a channel region between a source extension region and a drain extension region by decreasing the length of a gate electrode. CONSTITUTION: A semiconductor substrate is prepared. The gate electrode(220) is formed on the semiconductor substrate(200). Deep source/drain regions(230) are formed on the semiconductor substrate outside the sidewall of the gate electrode. Source/drain extension regions(240) extend toward the channel region under the gate electrode, thinner than the deep source/drain regions on the semiconductor substrate. The first silicide layer of the first thickness is formed on the deep source/drain regions. The second silicide layer extends from the first silicide layer on a partial surface of the source/drain extension region, having the second thickness smaller than the first thickness of the first silicide layer.
申请公布号 KR100327347(B1) 申请公布日期 2002.02.22
申请号 KR20000042154 申请日期 2000.07.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YOUNG WUG;YANG, JEONG HWAN
分类号 H01L21/28;H01L21/336;H01L29/78;(IPC1-7):H01L21/336 主分类号 H01L21/28
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