发明名称 |
ROTARY WAFER TREATMENT DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To avoid a phenomenon that a chemical agent remains on the rear surface of a wafer after washing and drying the wafer in wafer treatment where a chemical agent is supplied to surfaces of a wafer while rotating the wafer by a rotor. SOLUTION: As a washing means, there are provided a spray nozzle 80 for spraying a surface of a wafer 10 with pure water, a pure water nozzle 50 for spraying the rear surface of the wafer 10 with pure water and a pure water nozzle 60 for spraying the outer periphery of the rear surface of a rotor 20 with pure water. By washing the outer periphery of the rear surface of the rotor 20 upon washing, reattachment of a chemical agent from the outer periphery of the rear surface of the rotor 20 to the rear surface of the wafer 10 is prevented. |
申请公布号 |
JP2002057138(A) |
申请公布日期 |
2002.02.22 |
申请号 |
JP20000238578 |
申请日期 |
2000.08.07 |
申请人 |
SUMITOMO PRECISION PROD CO LTD |
发明人 |
NAKADA KATSUTOSHI;FUJINE OSAMU |
分类号 |
G03F7/16;B08B3/02;B08B3/08;G02F1/13;G02F1/1333;H01L21/027;H01L21/304;H01L21/306 |
主分类号 |
G03F7/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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