发明名称 ROTARY WAFER TREATMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To avoid a phenomenon that a chemical agent remains on the rear surface of a wafer after washing and drying the wafer in wafer treatment where a chemical agent is supplied to surfaces of a wafer while rotating the wafer by a rotor. SOLUTION: As a washing means, there are provided a spray nozzle 80 for spraying a surface of a wafer 10 with pure water, a pure water nozzle 50 for spraying the rear surface of the wafer 10 with pure water and a pure water nozzle 60 for spraying the outer periphery of the rear surface of a rotor 20 with pure water. By washing the outer periphery of the rear surface of the rotor 20 upon washing, reattachment of a chemical agent from the outer periphery of the rear surface of the rotor 20 to the rear surface of the wafer 10 is prevented.
申请公布号 JP2002057138(A) 申请公布日期 2002.02.22
申请号 JP20000238578 申请日期 2000.08.07
申请人 SUMITOMO PRECISION PROD CO LTD 发明人 NAKADA KATSUTOSHI;FUJINE OSAMU
分类号 G03F7/16;B08B3/02;B08B3/08;G02F1/13;G02F1/1333;H01L21/027;H01L21/304;H01L21/306 主分类号 G03F7/16
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