发明名称 METHOD FOR MANUFACTURING GALLIUM NITRIDE SINGLE-CRYSTAL SUBSTRATE
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for manufacturing a gallium nitride single-crystal substrate for inhibiting the generation of cracks in the gallium nitride film when separating the gallium nitride film from a sapphire substrate. SOLUTION: The method includes a stage for forming a gallium nitride film on a sapphire substrate, a stage for heating the sapphire substrate within a range of 600 deg.C-1000 deg.C, and a stage for separating the gallium nitride film from the sapphire substrate by applying a laser beam to the rear of the heated sapphire substrate. Also, a stage for forming a silicon oxide film on the rear of the sapphire substrate at a stage before and after the stage for forming the gallium nitride film on the front of the sapphire substrate, and a stage for removing the silicon oxide film on the rear of the sapphire substrate are added further, thus obtaining the high-quality gallium nitride substrate without generating any cracks.</p>
申请公布号 JP2002057119(A) 申请公布日期 2002.02.22
申请号 JP20010127926 申请日期 2001.04.25
申请人 SAMSUNG CORNING CO LTD 发明人 PARK SUNG-SOO
分类号 B23K26/00;B23K101/40;C30B23/02;H01L21/02;H01L21/20;H01L21/268;(IPC1-7):H01L21/268 主分类号 B23K26/00
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