发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device that can form an upper electrode and a gate electrode, which have desired patterns, and to provide the manufacturing method. SOLUTION: The manufacturing method of the semiconductor device includes a process (a) for simultaneously forming the upper electrode 130 in a capacitive element 100 and the gate electrode 240 in a field effect transistor 200. The process (a) includes a process (a-1) for forming a conductive layer 40 for the upper electrode 130 and the gate electrode 240, a process (a-3) for forming a patterned resist layer R2 on the conductive layer 40 and a process (a-4) for removing a prescribed part of the conductive layer 40 and forming the upper electrode 130 and the gate electrode 240 with the resist layer R2 as a mask.
申请公布号 JP2002057220(A) 申请公布日期 2002.02.22
申请号 JP20000244347 申请日期 2000.08.11
申请人 SEIKO EPSON CORP 发明人 KUWAZAWA KAZUNOBU
分类号 H01L21/8247;H01L21/822;H01L21/8234;H01L21/8244;H01L27/04;H01L27/06;H01L27/10;H01L27/11;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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