| 摘要 |
PROBLEM TO BE SOLVED: To provide the junction state-inspecting device of an integrated circuit, that can quickly judge that the junction state of the integrated circuit packaged onto a circuit board using a simple method, and can be realized by an inexpensive configuration. SOLUTION: The inspecting device 1 selects test and drive pins 17 and 16 from the pins for signals of the integrated circuit 2. Then, a pulsive input signal is applied to the first parasitic diode 19 between the drive pin 16 and a ground pin 18 and a substrate resistor 20, and an output signal generated between a pattern 17a on the circuit board, where the test pine 17 is jointed, and the ground pin 18 is detected. In addition, the amplitude of the detected output signal is compared with a reference value, thus judging as to whether the junction state between the test pin 17 and pattern 17a is confirming.
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