TEST METHOD FOR SEMICONDUCTOR MEMORY, TEST DEVICE FOR SEMICONDUCTOR MEMORY

摘要

PROBLEM TO BE SOLVED: To provide a test method for shortening a test time of a flash memory. SOLUTION: The number of memory cells being not yet erased are counted for whenever a memory cell being not yet erased during a read-out test confirming whether storage of memory cells are erased or not after erasure operation, the number of performing erasure operation is selected in accordance with the number of memory cells being not yet erased and a test is performed.