发明名称 Method for forming a trench in a semiconductor substrate
摘要 A method for forming a trench in a semiconductor substrate includes configuring a mask on the substrate. The mask has a window in which a substrate surface is uncovered. The substrate is electrochemically etched proceeding from the substrate surface. A porous substrate is formed in a trench-shaped region proceeding from the substrate surface. The trench is formed by removing the porous substrate from the trench-shaped region.
申请公布号 US2002022338(A1) 申请公布日期 2002.02.21
申请号 US20010917554 申请日期 2001.07.27
申请人 KIRCHHOFF MARKUS 发明人 KIRCHHOFF MARKUS
分类号 H01L21/306;H01L21/311;H01L21/334;H01L21/8242;(IPC1-7):H01L21/76 主分类号 H01L21/306
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