发明名称 Configuration and method for the low-loss writing of an MRAM
摘要 A configuration and method for low-loss writing of an MRAM includes setting voltages at bit lines and word lines such that the voltage across the memory cells between a selected word/bit line and the individual bit line/word lines is minimal. A voltage drop occurs on a selected word/bit line connected to a particular memory cell when writing into the memory cell and voltages at the bit/word lines are set to minimize a cell voltage across the memory cells between a selected word/bit line and individual bit/word lines. A voltage drop occurs on a selected word/bit line connected to a particular memory cell when writing into the particular cell, and, when a voltage V1 and a voltage V2<V1 are present at a respective end of the selected word line/bit lines, the cell field is configured to have all of the bit/word lines set to voltages (V1+V2)/2 and to have a maximum cell voltage of ±(V1-V2)/2.
申请公布号 US2002021543(A1) 申请公布日期 2002.02.21
申请号 US20010922471 申请日期 2001.08.03
申请人 GOGL DIETMAR;KANDOLF HELMUT;LAMMERS STEFAN 发明人 GOGL DIETMAR;KANDOLF HELMUT;LAMMERS STEFAN
分类号 G11C11/14;G11C5/06;G11C11/15;G11C11/16;H01L21/8246;H01L27/105;H01L43/08;(IPC1-7):H01H47/18 主分类号 G11C11/14
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