发明名称 Method of fabricating a thin film transistor and manufacturing equipment
摘要 A method of forming a thin film transistor includes forming a gate electrode on a substrate, forming an organic layer over the substrate having the gate electrode, curing the organic layer in a first chamber, transferring the substrate having the organic layer from the first chamber to a second chamber without exposing the substrate having the organic layer to oxygen atmosphere during transfer, forming an active layer on the organic layer in the second chamber; and forming source and drain electrodes on the active layer.
申请公布号 US2002022307(A1) 申请公布日期 2002.02.21
申请号 US20010855694 申请日期 2001.05.16
申请人 发明人 PARK YONG-IN;KIM WOONG-KWON
分类号 H01L21/00;H01L21/336;H01L29/49;(IPC1-7):H01L21/00;H01L21/84;H01L21/31;H01L21/469 主分类号 H01L21/00
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