发明名称 Verfahren zur Behandlung eines Substrats aus Silizium
摘要 A processed Si product suitable for use as, for example, an X-ray mask, is produced by a process having the steps of preparing a non-porous Si substrate, changing by anodization at least a portion of the substrate into porous Si thereby forming at least one porous Si region penetrating the substrate from one to the other side thereof, and effecting an etching on the substrate by using an etchant containing hydrofluoric acid so as to remove the porous Si region. The substrate may be provided with an etching stop layer. In such a case, an unsupported membrane region formed by the etching stop layer is left after the removal of the porous Si region. <IMAGE>
申请公布号 DE69232347(D1) 申请公布日期 2002.02.21
申请号 DE1992632347 申请日期 1992.09.25
申请人 CANON K.K., TOKIO/TOKYO 发明人 SAKAGUCHI, KIYOFUMI;YONEHARA, TAKAO
分类号 G03F1/14;G03F1/22;H01L21/306;(IPC1-7):H01L21/76;H01L21/20 主分类号 G03F1/14
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