发明名称 Method of detecting defects in a photographic film
摘要 <p>A method of locating a linear defect on a photographic element, the element having a useful imaging width and the defect aligned with length of the element, includes the steps of: exposing a region of the element to create a latent image which is substantially uniform across the useful imaging width of the element; developing the latent image to produce a density signal; sampling the density signal with a photometric device; and analyzing the sampled density data for the presence of significant deviations aligned with the length of the element to locate the defect. &lt;IMAGE&gt; &lt;IMAGE&gt;</p>
申请公布号 EP1180897(A1) 申请公布日期 2002.02.20
申请号 EP20010202891 申请日期 2001.07.30
申请人 EASTMAN KODAK COMPANY 发明人 CAHILL, NATHAN DAVID;SPENCE, JOHN PATRICK
分类号 G03C1/765;H04N1/00;H04N1/409;(IPC1-7):H04N1/00;H04N1/407 主分类号 G03C1/765
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