发明名称 |
Method of detecting defects in a photographic film |
摘要 |
<p>A method of locating a linear defect on a photographic element, the element having a useful imaging width and the defect aligned with length of the element, includes the steps of: exposing a region of the element to create a latent image which is substantially uniform across the useful imaging width of the element; developing the latent image to produce a density signal; sampling the density signal with a photometric device; and analyzing the sampled density data for the presence of significant deviations aligned with the length of the element to locate the defect. <IMAGE> <IMAGE></p> |
申请公布号 |
EP1180897(A1) |
申请公布日期 |
2002.02.20 |
申请号 |
EP20010202891 |
申请日期 |
2001.07.30 |
申请人 |
EASTMAN KODAK COMPANY |
发明人 |
CAHILL, NATHAN DAVID;SPENCE, JOHN PATRICK |
分类号 |
G03C1/765;H04N1/00;H04N1/409;(IPC1-7):H04N1/00;H04N1/407 |
主分类号 |
G03C1/765 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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