发明名称 METHOD AND DEVICE FOR ANALYZING MAGNETIZATION DISTRIBUTION OF MAGNETIC PARTICLES
摘要 PROBLEM TO BE SOLVED: To provide an analysis device that can perform highly precise analysis by taking an influence of a particle located in the depth direction into consideration, in magnetization distribution analysis for each particle in a two-dimensional cross section. SOLUTION: An impressed magnetic field in the center position of each particle is calculated (S10), B0 is set to an assumed magnetic field data BIcount in the center position of the magnetic particle (S11), magnetization and a magnetic moment of each particle are calculated (S13), a magnetic field formed by a particle group of the particles other than the particle in which the magnetic field is found is calculated (S14), and a magnetic field by the particle group of the attentioned particle desired to find the magnetic field is calculated (S15). The impressed magnetic field and the magnetic field formed by the other particles are added thereafter to find a magnetic field data with the other particle taken into account (S16), the calculation for all the particles n in the two-dimensional cross section is carried out (S17), and the calculation is finished when the assumed magnetic field distribution in the center position of the magnetic particle gets consistent with a magnetic field distribution where the other particles are taken into account.
申请公布号 JP2002055149(A) 申请公布日期 2002.02.20
申请号 JP20000245136 申请日期 2000.08.11
申请人 CANON INC 发明人 NAGAI SHINGO
分类号 G01R33/12;G01N27/72;(IPC1-7):G01R33/12 主分类号 G01R33/12
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