发明名称 |
SEMICONDUCTOR SUBSTRATE AND MANUFACTURING METHOD THEREOF, AND SEMICONDUCTOR DEVICE AND PATTERN FORMATION METHOD |
摘要 |
PURPOSE: A semiconductor substrate is provided to improve a pattern profile in a photolithographic process by using a nitride semiconductor substrate having a scattering portion. CONSTITUTION: A semiconductor substrate comprises a semiconductor layer(100) comprising a group III nitride as a main component. A GaN layer is used as the semiconductor layer(100). A scattering portion(100a) for scattering an incident beam of light incident on one plane of the semiconductor layer is provided on another plane or inside of the semiconductor layer(100). Preferably, a plurality of concave and convex parts are used as the scattering portion(100a).
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申请公布号 |
KR20020013438(A) |
申请公布日期 |
2002.02.20 |
申请号 |
KR20010047696 |
申请日期 |
2001.08.08 |
申请人 |
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发明人 |
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分类号 |
H01L21/027;G03F7/09;H01L33/00;H01L33/20;H01L33/22;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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