发明名称 SEAMLESS, MASKLESS LITHOGRAPHY SYSTEM USING SPATIAL LIGHT MODULATOR
摘要 The invention is a seamless, projection lithography system that eliminates the need for masks through the use of a programmable Spatial Light Modulator (SLM) with high parallel processing power. Illuminating the SLM with a radiation source (1) provides a patterning image of many pixels via a projection system (4) onto a substrate (5). The preferred SLM is a Deformable Micromirror Device (3) for reflective pixel selection using a synchronized pulse laser. An alternative SLM is a Liquid Crystal Light Valve (LCLV) (45) for pass-through pixel selection. Electronic programming enables pixel selection control for error correction of faulty pixel elements. Pixel selection control also provides for negative and positive imaging and for complementary overlapping polygon development for seamless uniform dosage. The invention provides seamless scanning motion by complementary overlap to equalize radiation dosage, to expose a pattern on a large area substrate (5). The invention is suitable for rapid prototyping, flexible manufacturing, and even mask making.
申请公布号 EP0914626(A4) 申请公布日期 2002.02.20
申请号 EP19960925490 申请日期 1996.07.25
申请人 ANVIK CORPORATION;JAIN, KANTI;DUNN, THOMAS J.;HOFFMAN, JEFFREY M. 发明人 JAIN, KANTI;DUNN, THOMAS, J.;HOFFMAN, JEFFREY, M.
分类号 G02B26/08;G03F7/20 主分类号 G02B26/08
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