发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a semiconductor device is provided to form a crystalline silicon film on a glass substrate by a method wherein a metal element for promoting crystallization of silicon is held in contact with the surface of an amorphous silicon film formed on an insulation surface and heat-treated at the crystallization temperature of the amorphous silicon film or above. CONSTITUTION: A silicon film(12) is deposited as a ground film on a glass substrate(11) and an amorphous silicon film(13) is deposited by a low-pressure thermal CVD(chemical vapor deposition) method. A nickel acetate solution which is regulated to have a prescribed concentration and comes to be a metal element source for promoting crystallization is applied on the surface of the amorphous silicon film, so that a water film of the nickel acetate solution is formed. A spin coating process is performed while an excessive nickel acetate solution is splashed. The glass substrate is disposed on a surface plate(16) having a high-precision flat surface. The glass substrate is heat-treated at the crystallization temperature of the amorphous silicon film or above and gradually cooled down at a prescribed speed.
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申请公布号 |
KR100326886(B1) |
申请公布日期 |
2002.02.20 |
申请号 |
KR19990017303 |
申请日期 |
1999.05.14 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY K.K. |
发明人 |
YAMAZAKI SHUNPEI;TERAMOTO SATOSHI;KOYAMA,JUN;MIYANAGA AKIHARU |
分类号 |
H01L29/786;H01L21/20;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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