发明名称 Linear ramping digital-to-analog converter for integrated circuit tester
摘要 An arbitrary waveform generator (AWG) generates an output signal that linearly ramps between discrete levels to approximate a smoothly varying waveform. The AWG includes a digital-to-analog converter (DAC) formed by a set of N ramp generators, with each ramp generator producing output currents that ramp at adjustable rates between discrete levels in response to a change in state of an input waveform data bit. The output currents of all N ramp generators of the DAC, which have separately weighted magnitude levels, are summed and converted to a proportional voltage to produce the AWG's output signal.
申请公布号 US6348785(B2) 申请公布日期 2002.02.19
申请号 US20010773168 申请日期 2001.01.30
申请人 CREDENCE SYSTEMS CORPORATION 发明人 WOHLFARTH PAUL DANA
分类号 G01R31/28;G01R31/319;(IPC1-7):G01R31/02;G01R1/04;H03K17/00;H03B21/00 主分类号 G01R31/28
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