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发明名称
IC TESTING APPARATUS AND METHOD
摘要
申请公布号
SG86329(A1)
申请公布日期
2002.02.19
申请号
SG19980002538
申请日期
1998.07.21
申请人
HITACHI ELECTRONICS ENGINEERING CO., LTD.
发明人
WADA, YUJI;FUKUDA, KAORU;KAMIKO, YOSHIO;MOCHIDUKI, MASAAKI
分类号
G01R31/3193;G11C29/56;(IPC1-7):G01R31/28;G01R31/30;G01R31/26;G01R31/27
主分类号
G01R31/3193
代理机构
代理人
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地址
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