发明名称 SCANNING TYPE SHAPE ANALYZER FOR ANALYZING SPACE OF WIDE INSPECTION FACE
摘要 PROBLEM TO BE SOLVED: To remarkably shorten a measuring time. SOLUTION: This scanning type shape analyzer calculates the next obtaining position P' using a face shape calculated based on a measured image data obtained n the present obtaining position P and the present obtaining attitude, controls to move to the next obtaining position where an intersection position Ro of an optical axis Oa of a beam and a reference face 1e in a measuring head 1 is calculated, and calculates the next obtaining attitude in the next obtaining position P' using the face shape obtained in the present obtaining position P and the present obtaining attitude to conduct controlling to make a reference axis Ra in the measuring head 1 consistent with the calculated obtaining attitude.
申请公布号 JP2002048522(A) 申请公布日期 2002.02.15
申请号 JP20010151398 申请日期 2001.05.21
申请人 MITSUTOYO CORP 发明人 KAWASAKI KAZUHIKO;MITSUYA NAOKI;HAINO HIROSHI
分类号 G01B11/24;(IPC1-7):G01B11/24 主分类号 G01B11/24
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