发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device which can form a proper crystallized film with high yield and reduce the stress exerted on an amorphous film during temperature rise in a crystallizing process. SOLUTION: The manufacturing method comprises a step of forming, on a glass substrate 101 an absorptive film 103 containing an ultra-elastic material elastically deformable over several percents; a step of forming an amorphous silicon film 105 on the glass substrate 101; and a step of irradiating the absorptive film 103 with electromagnetic waves to heat this film 103 and to crystallize the silicon film 105, utilizing the heat thereof.
申请公布号 JP2002050576(A) 申请公布日期 2002.02.15
申请号 JP20000235349 申请日期 2000.08.03
申请人 SANYO ELECTRIC CO LTD 发明人 SOTANI NAOYA
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20 主分类号 H01L21/20
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