发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device, using an SOI for preventing nonuniformity in coating of a photoresist and disconnection in the step part of metal wiring caused by a sharp step formation, when the step of a silicon active layer and a semiconductor supporting substrate is increased, when forming the opening part of the semiconductor support substrate for forming a protecting element on the semiconductor supporting substrate. SOLUTION: By forming a side spacer, composed of a polycrystal silicon on the sidewall of the step between the silicon active layer and the semiconductor supporting substrate, the form of the step is improved.
申请公布号 JP2002050746(A) 申请公布日期 2002.02.15
申请号 JP20000237468 申请日期 2000.08.04
申请人 SEIKO INSTRUMENTS INC 发明人 HASEGAWA TAKASHI
分类号 H01L21/762;H01L21/822;H01L21/8238;H01L27/04;H01L27/06;H01L27/092;H01L29/786;(IPC1-7):H01L27/06;H01L21/823 主分类号 H01L21/762
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