发明名称 VERTICAL PROBE CARD
摘要 PROBLEM TO BE SOLVED: To provide a vertical probe card which can be restored when it has become immesurable and which can be soldered easily to the connection part of a board. SOLUTION: In the vertical probe card, flanges 12 which are locked to through holes 31 in a pin support plate 30 are formed at head parts of pins 10, through holes 221 and through holes 223 whose interval is identical to the interval between the through holes in the support plate are opened in an upper support plate 220 and a lower support plate 230, the upper support plate and the lower support plate are supported by support leg parts in such a way that positions of the through holes in the upper support plate and those of the through holes in the lower support plate are deviated, connection parts 22 at rear ends of conductors 20 passed through the through holes in the upper support plate and the lower support plate are soldered to connection parts 310 of a board 300, contact parts 11 coming into contact with the flanges at the heads of the pins at tip ends of the conductors protrude from the through holes in the lower support plate, and the conductors passed through the upper support plate and the lower support plate are fixed to the surface 220 of the upper support plate by fixation materials 240.
申请公布号 JP2002048818(A) 申请公布日期 2002.02.15
申请号 JP20000233128 申请日期 2000.08.01
申请人 JAPAN ELECTRONIC MATERIALS CORP 发明人 OKUBO MASAO;OKUBO KAZUMASA;TANI YOSHIAKI;TANAKA JUNYA
分类号 G01R1/073;G01R31/28;H01L21/66;(IPC1-7):G01R1/073 主分类号 G01R1/073
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