发明名称 CHEMICAL VAPOR DEPOSITION METHOD FOR AMORPHOUS SILICON AND RESULTING THIN FILM
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for depositing an amorphous silicon thin film layer on a substrate at a very high deposition rate while maintaining excellent thin film quality. SOLUTION: The plasma volume in a process chamber is defined. A total flow velocity of a gaseous mixture introduced into the chamber (the total flow velocity of each gas) is also defined. A process parameter including the plasma volume and the total flow velocity are defined, and thereafter, the process parameter is held to prescribed values and prescriged relation in the process of the deposition of an amorphous silicon thin film.</p>
申请公布号 JP2002047568(A) 申请公布日期 2002.02.15
申请号 JP20010176532 申请日期 2001.06.12
申请人 AGILENT TECHNOL INC 发明人 THEIL JEREMY A;KOOI GERRIT J;VARGHESE RONNIE P
分类号 C23C16/24;C23C16/44;C23C16/50;C23C16/52;H01L21/205;H01L31/0376;H01L31/04;H01L31/20;(IPC1-7):C23C16/24 主分类号 C23C16/24
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