| 摘要 |
PROBLEM TO BE SOLVED: To provide a memory evaluating system which can obtain FBM required for defect analyzing and write-in data in a memory mat at the time of fail. SOLUTION: This system is a memory evaluating system in which selection is performed by a test being equivalent to a test of a memory module loaded in a PC, which can analyze a defective device, the system is constituted of a mother board 1 in which a reference device or the like is loaded, an evaluating board 2 in which ASIC or the like is loaded, a memory tester 3, or the like, test devices to be tested DUT1-DUT3 are inserted into sockets 7-9 for the device to be tested, devices DUTA, DUTB for obtaining FBM (for holding write-in data at the time of fail) being a normal product and the same product as a device to be tested are inserted into sockets 10, 11 for obtaining FBM (for holding write-in data at the time of fail), two pieces out of three pieces are selected, the FBM is simultaneously obtained for the DUTA, DUTB, also, write-in data at the time of fail of one piece out of three pieces is held in either of the DUTA, DUTB.
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