| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that a test administrator needs to repeatedly plan test conduction order since the administrator can not grasp test resources needed to conduct a test again after debugging is completed. SOLUTION: This device has a test item administration part 10 having a test item listing means 11 for administering the test items of a test conducted for software, a test resource information means 12 which administers test resource information needed to conduct each test, and a test result input means 13 for inputting a test conduction result, a bug information management part 20 having a bug information input means 21 for inputting a bug information record 20A, a test conduction order output means 40 which generates and outputs test conduction order regarding a bug handling state, and a debugging priority list output means 50 which generates and outputs debugging priority lists 51 by persons in charge of debugging.
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