发明名称 PHYSICAL-QUANTITY MEASURING APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To obtain a physical-quantity measuring apparatus in which an electric discharge to the surface of a sample or its peripheral device from a probe is hard to generate. SOLUTION: The physical quantity of the sample 2 is measured on the basis of the displacement or the vibration of the probe 3 generated due to an electrostatic attractive force acting between the probe 3 to which a voltage, in which an AC component and a DC component are superposed, is applied and the surface of the sample 2 arranged so as to face the probe 3. At this time, the feedback amount to the DC component of the applied voltage applied to the probe 3 is controlled on the basis of the displacement or the vibration of the probe 3. Thereby, the state on the surface of the sample 2 is not distrubed, an electric current is not cut off, and the physical quantity can be measured smoothly and with enhanced measurement accuracy.</p>
申请公布号 JP2002048698(A) 申请公布日期 2002.02.15
申请号 JP20010136103 申请日期 2001.05.07
申请人 RICOH CO LTD 发明人 TAKAHASHI JUNICHI
分类号 G01B7/34;G01Q60/24;G01Q60/30;G01Q60/46;G03G5/00;G03G9/08;G03G21/00;(IPC1-7):G01N13/16 主分类号 G01B7/34
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