摘要 |
A system for inspecting a component, such as a die formed on a silicon wafer, is provided. The system includes a two dimensional inspection system that can locate one or more features, such as bump contacts on the die, and which can also generate feature coordinate data. The system also includes a three dimensional inspection system that is connected to the two dimensional inspection system, such as through an operating system of a processor. The three dimensional inspection system receives the feature coordinate data and generates inspection control data. |
申请人 |
SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS, INC.;GUEST, CLYDE, MAXWELL;ROY, RAJIV;HARRIS, CHARLES, K.;CARRINGTON, THOMAS, C.;CHTIOUI, YOUNES;WAHAWISAN, WEERAKIAT |
发明人 |
GUEST, CLYDE, MAXWELL;ROY, RAJIV;HARRIS, CHARLES, K.;CARRINGTON, THOMAS, C.;CHTIOUI, YOUNES;WAHAWISAN, WEERAKIAT |