发明名称 Semiconductor integrated circuit device and method for making the same
摘要 A method for making a semiconductor integrated circuit device comprises the steps of: (a) depositing a first underlying film made of titanium nitride, on an insulating film having a plurality of through-holes; (b) depositing a tungsten film on the first underlying film, and etching the tungsten film back by means of a fluorine-containing plasma thereby leaving the tungsten film only in the connection holes; (c) sputter etching the surface of the first underlying film to remove the fluorine from the surface of the first underlying film; and (d) forming an aluminum film on the first underlying film. The semiconductor integrated circuit device obtained by the method is also described.
申请公布号 US2002019124(A1) 申请公布日期 2002.02.14
申请号 US20010933163 申请日期 2001.08.21
申请人 SUZUKI MASAYUKI;NISHIHARA SHINJI;SAHARA MASASHI;ISHIDA SHINICHI;ABE HIROMI;TOHDA SONOKO;UCHIYAMA HIROYUKI;TSUGANE HIDEAKI;YOSHIURA YOSHIAKI 发明人 SUZUKI MASAYUKI;NISHIHARA SHINJI;SAHARA MASASHI;ISHIDA SHINICHI;ABE HIROMI;TOHDA SONOKO;UCHIYAMA HIROYUKI;TSUGANE HIDEAKI;YOSHIURA YOSHIAKI
分类号 H01L23/52;H01L21/3205;H01L21/60;H01L21/768;H01L23/522;(IPC1-7):H01L21/476;H01L21/44 主分类号 H01L23/52
代理机构 代理人
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