发明名称 Method for manufacturing semiconductor device using group III nitride compound
摘要 A flip-chip-type device is formed from a plurality of flip-chip semiconductor device units integrated together on a common substrate having a Group III nitride compound semiconductor layer. A sealing resin is laminated on a surface of the common substrate cured, and the substrate is then divided into individual sealed flip-chip semiconductor devices. Because the positive and negative electrodes are formed on the same side of the devices, the sealing resin need only be applied to the side of the substrate on which the electrodes are formed. Metal pillars may be formed on the electrodes and extend through the cured resin to electrically connect the flip-type semiconductor device to an external source and produce a self-contained package.
申请公布号 US2002017727(A1) 申请公布日期 2002.02.14
申请号 US20010977939 申请日期 2001.10.17
申请人 TOYODA GOSEI CO., LTD. 发明人 UEMURA TOSHIYA
分类号 H01L21/60;H01L23/31;H01L25/075;H01L33/00;H01L33/52;H01L33/54;(IPC1-7):H01L21/44;H01L21/48;H01L21/50;H01L23/48;H01L23/52;H01L29/40 主分类号 H01L21/60
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