发明名称 Protection circuit of field effect transistor and semiconductor device
摘要 There is provided a protection circuit of a field effect transistor having a structure which can be fabricated without restricting a pattern layout and without increasing a process step. A protection circuit of a field effect transistor is a protection circuit of a Schottky gate HFET, and is a circuit in which a forward direction diode and a reverse direction diode are cascade-connected to form a diode unit and two such diode units are connected in series, and a gate line connected to a gate electrode of the HFET is grounded through the protection circuit. The diodes are diodes formed integrally with the Schottky gate HFET which is protected against surge breakdown, and are constituted as Schottky barrier diodes made of an n+-GaAs cap layer formed on a GaAs substrate and Schottky electrodes formed on the n+-GaAs cap layer.
申请公布号 US2002018328(A1) 申请公布日期 2002.02.14
申请号 US20010862894 申请日期 2001.05.22
申请人 NAKAMURA MITSUHIRO;WADA SHINICHI 发明人 NAKAMURA MITSUHIRO;WADA SHINICHI
分类号 H01L27/04;H01L21/338;H01L21/822;H01L27/02;H01L29/812;H03K17/0812;(IPC1-7):H02H3/20 主分类号 H01L27/04
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