发明名称 Systems and methods for two-sided etch of a semiconductor substrate
摘要 A system and method for two-sided etch of a semiconductor substrate. Reactive species are generated and flowed toward a substrate for processing. A diverter is positioned between the generation chamber and the substrate. A portion of the reactive species flows through the diverter for processing the front of the substrate. Another portion is diverted around the substrate to the backside for processing. A flow restricter is placed between the substrate and the exhaust system to increase the residence time of reactive species adjacent to the backside.
申请公布号 US2002017364(A1) 申请公布日期 2002.02.14
申请号 US20010907127 申请日期 2001.07.16
申请人 LUO LAIZHONG;HOLDEN YING;GEORGE RENE;GUERRA ROBERT;WIESNOSKI ALLAN;KUHL NICOLE;RANFT CRAIG;MANTRIPRAGADA SAI 发明人 LUO LAIZHONG;HOLDEN YING;GEORGE RENE;GUERRA ROBERT;WIESNOSKI ALLAN;KUHL NICOLE;RANFT CRAIG;MANTRIPRAGADA SAI
分类号 H01L21/302;H01J37/32;H01L21/00;H01L21/3065;(IPC1-7):C23F1/02 主分类号 H01L21/302
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