发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
A method of manufacturing a semiconductor device comprises providing on a semiconductor substrate a mask pattern having a fully opened region and a partially opened region. Impurities are selectively introduced into an impurity introduction region of the semiconductor substrate through the fully opened region and the partially opened region of the mask pattern to form areas having high and low impurity densities in the impurity introduction region.
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申请公布号 |
US2002019104(A1) |
申请公布日期 |
2002.02.14 |
申请号 |
US19950573145 |
申请日期 |
1995.12.15 |
申请人 |
MIYAGI MASANORI |
发明人 |
MIYAGI MASANORI |
分类号 |
H01L21/225;H01L21/265;H01L21/266;H01L21/336;H01L21/8234;H01L27/088;H01L29/78;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/225 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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