发明名称 Buried channel strained silicon FET using a supply layer created through ion implantation
摘要 A circuit including at least one strained channel, enhancement mode FET, and at least one strained channel, depletion mode FET. The depletion mode FET includes an ion implanted dopant supply. In exemplary embodiments, the FETs are surface channel or buried channel MOSFETS. In another exemplary embodiment, the FETs are interconnected to form an inverter.
申请公布号 US2002017644(A1) 申请公布日期 2002.02.14
申请号 US20010859138 申请日期 2001.05.16
申请人 FITZGERALD EUGENE A. 发明人 FITZGERALD EUGENE A.
分类号 H01L21/335;H01L21/762;H01L21/8234;H01L27/088;H01L29/10;H01L29/778;H01L29/78;H01L29/786;(IPC1-7):H01L27/108;H01L29/04;H01L29/76;H01L31/036;H01L31/112 主分类号 H01L21/335
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