发明名称 Waveform measuring apparatus
摘要 A frequency synthesized signal generator outputs a frequency synthesized signal having a frequency equal to a repetition frequency of a signal under test by employing a reference signal. A phase comparator detects a phase difference between a phase of the frequency synthesized signal and a phase of the signal under test, and outputs a phase difference signal. A voltage control oscillator generates a reference signal phase-synchronized with the signal under test based on the phase difference signal output from the phase comparator, and feeds the reference signal back to the frequency synthesized signal generator. A sampling signal generator circuit generates a sampling signal applied to a sampling section by employing the reference signal output from the voltage control oscillator.
申请公布号 US2002017901(A1) 申请公布日期 2002.02.14
申请号 US20010924331 申请日期 2001.08.08
申请人 ANRITSU CORPORATION 发明人 OTSUBO TOSHINOBU;OTANI AKIHITO;WATANABE HIROTO
分类号 G01R13/20;G01R13/34;(IPC1-7):G01R13/34 主分类号 G01R13/20
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