发明名称 |
Waveform measuring apparatus |
摘要 |
A frequency synthesized signal generator outputs a frequency synthesized signal having a frequency equal to a repetition frequency of a signal under test by employing a reference signal. A phase comparator detects a phase difference between a phase of the frequency synthesized signal and a phase of the signal under test, and outputs a phase difference signal. A voltage control oscillator generates a reference signal phase-synchronized with the signal under test based on the phase difference signal output from the phase comparator, and feeds the reference signal back to the frequency synthesized signal generator. A sampling signal generator circuit generates a sampling signal applied to a sampling section by employing the reference signal output from the voltage control oscillator.
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申请公布号 |
US2002017901(A1) |
申请公布日期 |
2002.02.14 |
申请号 |
US20010924331 |
申请日期 |
2001.08.08 |
申请人 |
ANRITSU CORPORATION |
发明人 |
OTSUBO TOSHINOBU;OTANI AKIHITO;WATANABE HIROTO |
分类号 |
G01R13/20;G01R13/34;(IPC1-7):G01R13/34 |
主分类号 |
G01R13/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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