发明名称 |
Semiconductor memory device |
摘要 |
The semiconductor memory device in accordance with the present invention allows evaluation of input/output terminal dependency of noise characteristic at the time of data output, it has a normal operation mode and a test mode, and includes a plurality of output buffers and selecting means for selectively activating at least one output buffer among the plurality of output buffers in the test mode.
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申请公布号 |
US2002018383(A1) |
申请公布日期 |
2002.02.14 |
申请号 |
US20010968899 |
申请日期 |
2001.10.03 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
AKAMATSU HIROSHI;HAYASHIKOSHI MASANORI |
分类号 |
G11C7/00;G11C29/00;G11C29/14;(IPC1-7):G11C29/00 |
主分类号 |
G11C7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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