发明名称 |
Resist composition and method for manufacturing semiconductor device using the resist composition |
摘要 |
A resist composition comprises: at least one type of a first compound having two or more intramolecular adamantyl structures represented by the chemical formula 1 below; a base resin; and a second compound which generates an acid by active beam irradiation. <CHEM> wherein X is -(OCO)m-(CH2)n-(COO)m-, where m = 0 or 1 and n = 0, 1, 2 or 3 provided when n = 0, m = 0; and Y and Z are H, OH, F, Cl, Br, R or COOR, where Y may be Z, or Y and Z may be introduced in a single adamantyl structure and R represents a straight or branched alkyl group having 1 to 8 carbon atoms. <IMAGE> |
申请公布号 |
EP1179749(A1) |
申请公布日期 |
2002.02.13 |
申请号 |
EP20010118916 |
申请日期 |
2001.08.03 |
申请人 |
SEMICONDUCTOR LEADING EDGE TECHNOLOGIES, INC.;IDEMITSU PETROCHEMICAL CO., LTD. |
发明人 |
TORIUMI, MINORU;SATOU, ISAO;WATANABE, HIROYUKI;KATAI, SHUNJI;SUZUKI, SHINTARO |
分类号 |
G03F7/028;C07C35/37;C07C69/96;C08K5/02;C08K5/09;C08K5/10;C08K5/17;C08K5/41;C08L33/02;C08L33/06;C08L101/00;G03F7/004;G03F7/038;G03F7/039;H01L21/027 |
主分类号 |
G03F7/028 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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