发明名称 Non-intrusive pellicle height measurement system
摘要 A method to monitor a dimension of a pellicle includes projecting a first light signal against a surface of the pellicle. A second light signal reflected from the surface of the pellicle is detected, with the second light signal being a representation of the first light signal. The method determines if the dimension of the pellicle is within an allowable value based on a characteristic of the detected second light signal. The characteristic of the detected second light signal can include time periods between pulses of the detected second light signal, an intensity of the detected second light signal, or a positional displacement of the detected second light signal.
申请公布号 US6346986(B1) 申请公布日期 2002.02.12
申请号 US20000524999 申请日期 2000.03.14
申请人 WAFERTECH, INC. 发明人 NGUYEN PHONG T.
分类号 G01B11/06;G03F1/00;G03F1/14;(IPC1-7):G01B11/24 主分类号 G01B11/06
代理机构 代理人
主权项
地址