发明名称 |
Vapor-phase processing method capable of eliminating particle formation |
摘要 |
A method for processing a substrate includes the steps of determining an allowable margin of process condition such that a substrate is processed without forming particles, selecting a process condition of a substrate for a production process such that the process condition falls in the allowable margin in the production process, and carrying out a processing of the substrate in the production process at the selected process condition, wherein the step of determining the allowable margin includes the steps of introducing an optical beam to an atmosphere in which the substrate is processed in the step of determining the allowable margin, and detecting scattering of the optical beam.
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申请公布号 |
US6346425(B1) |
申请公布日期 |
2002.02.12 |
申请号 |
US20000651186 |
申请日期 |
2000.08.30 |
申请人 |
TOKYO ELECTRON LIMITED;NEC CORPORATION |
发明人 |
ITO NATSUKO;MORIYA TSUYOSHI;UESUGI FUMIHIKO;MORIYA SHUJI;AOMORI MASARU;KATO YOSHINORI;TACHIBANA MITSUHIRO |
分类号 |
H01L21/302;C23C16/44;C23C16/52;G01N21/47;H01L21/205;H01L21/285;H01L21/3065;H01L21/66;(IPC1-7):H01L21/00;H01L21/44;H01L21/31;G01R31/26 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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