发明名称 HEAT TREATMENT SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a heat treatment system for evenly heat treating among a plurality of wafers. SOLUTION: The heat treatment system 1 comprises a wafer boat 4 for horizontally holding a plurality of wafers and a heater in which the wafer boat 4 is arranged. The heater 3 has a plurality of main heaters 13a to 13e vertically arranged and auxiliary heaters 14a to 14e and 15a to 15e arranged in an adjacent area of the main heater arranged side by side.
申请公布号 JP2002043238(A) 申请公布日期 2002.02.08
申请号 JP20000229449 申请日期 2000.07.28
申请人 SEIKO EPSON CORP 发明人 HIGUCHI MITSUAKI
分类号 H05B3/66;F27B5/14;F27D11/02;H01L21/205;H01L21/22;(IPC1-7):H01L21/22 主分类号 H05B3/66
代理机构 代理人
主权项
地址