发明名称 APPARATUS AND METHOD OF FORMING METAL, ALLOY, SEMICONDUCTOR, ETC., IN FINE STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide an apparatus and a method of exactly burying a metal, alloy, semiconductor, etc., in fine structure having a high aspect ratio (depth of fine holes or trenches)/inlet diameter or width of fine holes or trenches), especially holes or trenches, and crystallize a formed film. SOLUTION: A buffer gas is introduced to bury in and planarize a fine structure (typically holes or trenches) having a high aspect ratio at least at one time in the period of forming the film, using a technique (sputter, evaporation, ion planting, CVD, etc.), of forming a film in a vapor phase. The formed film or a film made by other apparatus is irradiated instantaneously with a high- density energy to crystallize the film and improve the electric performance thereof.
申请公布号 JP2002043249(A) 申请公布日期 2002.02.08
申请号 JP20000269402 申请日期 2000.07.21
申请人 ASAMAKI TATSUO 发明人 ASAMAKI TATSUO;KASUKAWA TOSHIO;TOGA HAYATO;MOTOHASHI KENICHI
分类号 C23C14/22;C23C14/54;H01L21/20;H01L21/203;H01L21/28;H01L21/285;H01L21/3205;H01L23/52;(IPC1-7):H01L21/285;H01L21/320 主分类号 C23C14/22
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